Recent Papers on thin films and electromigration:

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  • Effects of mechanical stress on electromigration-driven transgranular void dynamics in passivated metallic thin films M. R. Gungor, D. Maroudas, and L.J. Gray
  • Kinetically Driven Growth Instability in Stressed Solids W. Barvosa-Carter, M. J. Aziz, L.J. Gray and T. Kaplan
  • Modeling a Growth Instability in Stressed Solids A.-V. Phan, T. Kaplan, L.J. Gray, D. Adelsteinsson, J. A. Sethian, W. Barvosa-Carter, and M. J. Aziz